One step calibration of industrial hyperspectral cameras

Abstract

<p>Hyperspectral imaging is gaining interest as an inline reflective analytical technique. The raw data is often applied for classification or process adjustments. Proper calibration can eliminate the background, noise, and artefacts. Further, it enables determination of area fractions and, via spectral information, chemical analysis. This paper demonstrates a simple, robust, and easy-to-operate calibration device for inline calibration of hyperspectral cameras in the range from 450 ​nm to 1840 ​nm. The design is flexible, made from easy sourced materials, and can be adapted to most industrial setups. Calibration of intensity, spatial and spectral information is combined in one device and is done in a single pass. Device alignment and subsequent image analysis provides a fast and easy calibration routine for hyperspectral cameras.</p>